Epitaxial growth of GaAsBi on thin step-graded InGaAs buffer layers
نویسندگان
چکیده
Abstract Molecular beam epitaxy growth and analysis of GaAsBi on compositional step-graded InGaAs buffer layers are presented in this study. The developed is only 240 nm thick, exhibits very low surface roughness while reaching up to 0.46% lattice-mismatch with a GaAs substrate. Reciprocal-space mappings showed that 500 thick 2.7%–5.3% Bi remain pseudomorphic the buffer, contrast grown were found incur 50% lattice relaxation. CuPt B -type ordering associated polarized photoluminescence also bismide buffers. Optical anisotropy strain-free 2.7% was further analysed by suite optical techniques indicating valence band splitting ∼40 meV. This study advances synthesis for optoelectronic device applications.
منابع مشابه
Fabrication and Characterization of 0.2μm InAlAs/InGaAs Metamorphic HEMT’s with Inverse Step- Graded InAlAs Buffer on GaAs Substrate
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ژورنال
عنوان ژورنال: Semiconductor Science and Technology
سال: 2022
ISSN: ['0268-1242', '1361-6641']
DOI: https://doi.org/10.1088/1361-6641/ac61ff